Secondary Ion Mass Spectroscopy of Solid Surfaces

2020-07-23 12:46:09

Compare Price
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of me... Read more
This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of applications. All the main parts of SIMS instruments are discussed in detail. Emphasising practical applications the book also considers the methods and analytical procedures for constitutional analysis of solids --- including metals, semiconductors, organic and biological samples. Methods of depth profiling, spatially multidimensional analysis and study of processes at the surface, such as adsorption, catalysis and oxidation, are given along with the application of SIMS in combination with other methods of surface analysis. Less

Book Details

ISBN9781466563735

Compare Prices

Store Availability Book Format Condition Price
eBooks.com In Stock Buy AUD 344.3
eBooks.comIn Stock
Format
Condition
Buy AUD 344.3
Available Discount
No Discount available

Join us and get access to all
your favourite books

Sign up for free and start exploring thousands of eBooks today.

Sign up for free